DTW for matching radon features: a pattern recognition and retrieval method

  • Authors:
  • K. C. Santosh;Bart Lamiroy;Laurent Wendling

  • Affiliations:
  • INRIA Nancy Grand Est Research Centre, LORIA - Campus Scientifique, Vandoeuvre-lés-Nancy Cedex, France;Nancy Université INPL, LORIA - Campus Scientifique, Vandoeuvre-lés-Nancy Cedex, France;LIPADE, Université Paris Descartes, Paris Cedex, France

  • Venue:
  • ACIVS'11 Proceedings of the 13th international conference on Advanced concepts for intelligent vision systems
  • Year:
  • 2011

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Abstract

In this paper, we present a method for pattern such as graphical symbol and shape recognition and retrieval. It is basically based on dynamic programming for matching the Radon features. The key characteristic of the method is to use DTW algorithm to match corresponding pairs of histograms at every projecting angle. This allows to exploit the Radon property to include both boundary as internal structure of shapes, while avoiding compressing pattern representation into a single vector and thus miss information, thanks to the DTW. Experimental results show that the method is robust to distortion and degradation including affine transformations.