Toward accurate feature detectors performance evaluation

  • Authors:
  • Pavel Smirnov;Piotr Semenov;Alexander Redkin;Anthony Chun

  • Affiliations:
  • Intel Labs;Intel Labs;Intel Labs;Intel Labs

  • Venue:
  • ICVS'11 Proceedings of the 8th international conference on Computer vision systems
  • Year:
  • 2011

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Abstract

The quality of interest point detectors is crucial for many computer vision applications. One of the frequently used integral methods to compare detectors' performance is repeatability score. In this work, the authors analyze the existing approach for repeatability score calculation and highlight some important weaknesses and drawbacks of this method. Then we propose a set of criteria toward more accurate integral detector performance measure and introduce a modified repeatability score calculation. We also provide illustrative examples to highlight benefits of the proposed method.