One shot similarity metric learning for action recognition

  • Authors:
  • Orit Kliper-Gross;Tal Hassner;Lior Wolf

  • Affiliations:
  • The Department of Mathematic and Computer Science, The Weizmann Institute of Science, Rehovot, Israel;The Department of Mathematics and Computer Science, The Open University, Raanana, Israel;The Blavatnik School of Computer Science, Tel-Aviv University, Tel-Aviv, Israel

  • Venue:
  • SIMBAD'11 Proceedings of the First international conference on Similarity-based pattern recognition
  • Year:
  • 2011

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Abstract

The One-Shot-Similarity (OSS) is a framework for classifierbased similarity functions. It is based on the use of background samples and was shown to excel in tasks ranging from face recognition to document analysis. However, we found that its performance depends on the ability to effectively learn the underlying classifiers, which in turn depends on the underlying metric. In this work we present a metric learning technique that is geared toward improved OSS performance. We test the proposed technique using the recently presented ASLAN action similarity labeling benchmark. Enhanced, state of the art performance is obtained, and the method compares favorably to leading similarity learning techniques.