Reactive, model-based monitoring in RFID-enabled manufacturing

Authors:
Yi Huang;Brian C. Williams;Li Zheng
Affiliations:
Computer Science and Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge 02139, MA, USA and Department of Industrial Engineering, Tsinghua University, Beijing 1008 ...;Computer Science and Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge 02139, MA, USA;Department of Industrial Engineering, Tsinghua University, Beijing 10084, China
Venue:
Computers in Industry
Year:
2011

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Abstract

Radio frequency identification (RFID) technology is widely applied throughout the manufacturing lifecycle to track important objects. It is imperative to establish a reactive monitoring system to convert large volumes of RFID data into meaningful information. Two major challenges must therefore be addressed: modeling complexity and monitoring efficiency. When the relationship between high-level ''untagged'' elements (business processes, indicators) and low-level ''tagged'' elements (persons, objects) becomes intricate, it will become difficult to define, maintain and reason by only using traditional rule-based event processing approaches. In order to resolve this problem, the paper proposes a reactive, model-based approach to monitor important elements by estimating their most likely states according to RFID information and a constraint-based model. The approach contains two phases. (1) The model-based programming phase formalizes RFID information and flexibly embeds them into the model that specifies the monitoring rules. (2) The model-based monitoring phase interprets the model and estimates desired states efficiently. Therefore, the RFID-enabled manufacturing units are capable of responding in a timely manner to unexpected disturbances or other important issues.