Two New Edge Detectors

Authors:
Charles J. Jacobus;Robert T. Chien
Affiliations:
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801/ Texas Instruments, Inc., Dallas, TX 75265.;Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801.
Venue:
IEEE Transactions on Pattern Analysis and Machine Intelligence
Year:
1981

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Abstract

This paper introduces two new edge detection algorithms. One uses multiple difference-based edge detectors. This scheme selects peak center by absolute maximum or center of mass techniques. The other algorithm is motivated by the observation that second-order enhancement improves human contour extraction, but generally confuses difference-based edge detectors. This algorithm translates intensity images into three state images (plus one, zero, and minus one), then uses multiple three-state edge masks to find edge positions. The second scheme has a multiple hardware implementation and interesting biological analogs. Finally, the two operators introduced are compared to some popular edge detection techniques from the literature.