Multiple Resolution Texture Analysis and Classification

Authors:
Shmuel Peleg;Joseph Naor;Ralph Hartley;David Avnir
Affiliations:
Center for Automation Research, University of Maryland, College Park, MD 20742/ Department of Computer Science, the Hebrew University of Jerusalem, 91904 Jerusalem, Israel.;Department of Computer Science, the Hebrew University of Jerusalem, 91904 Jerusalem, Israel.;Center for Automation Research, University of Maryland, College Park, MD 20742.;Department of Organic Chemistry, the Hebrew University of Jerusalem, 91904 Jerusalem, Israel.
Venue:
IEEE Transactions on Pattern Analysis and Machine Intelligence
Year:
1984

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Abstract

Textures are classified based on the change in their properties with changing resolution. The area of the gray level surface is measured at serveral resolutions. This area decreases at coarser resolutions since fine details that contribute to the area disappear. Fractal properties of the picture are computed from the rate of this decrease in area, and are used for texture comparison and classification. The relation of a texture picture to its negative, and directional properties, are also discussed.