Texture feature-based image classification using wavelet package transform
ICIC'05 Proceedings of the 2005 international conference on Advances in Intelligent Computing - Volume Part I
Computing multidimensional Delaunay tessellations
Pattern Recognition Letters
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This paper deals with a class of image models based on random geometric processes. Theoretical and empirical results on properties of patterns generated using these models are summarized. These properties can be used as aids in fitting the models to images.