Model selection in kernel methods based on a spectral analysis of label information

  • Authors:
  • Mikio L. Braun;Tilman Lange;Joachim M. Buhmann

  • Affiliations:
  • Fraunhofer Institute FIRST, Intelligent Data Analysis Group, Berlin, Germany;Institute of Computational Science, ETH Zurich, Zurich, Switzerland;Institute of Computational Science, ETH Zurich, Zurich, Switzerland

  • Venue:
  • DAGM'06 Proceedings of the 28th conference on Pattern Recognition
  • Year:
  • 2006

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Abstract

We propose a novel method for addressing the model selection problem in the context of kernel methods. In contrast to existing methods which rely on hold-out testing or try to compensate for the optimism of the generalization error, our method is based on a structural analysis of the label information using the eigenstructure of the kernel matrix. In this setting, the label vector can be transformed into a representation in which the smooth information is easily discernible from the noise. This permits to estimate a cut-off dimension such that the leading coefficients in that representation contains the learnable information, discarding the noise. Based on this cut-off dimension, the regularization parameter is estimated for kernel ridge regression.