A fast probabilistic model for hypothesis rejection in SIFT-Based object recognition

  • Authors:
  • Patricio Loncomilla;Javier Ruiz-del-Solar

  • Affiliations:
  • Department of Electrical Engineering, Universidad de Chile, Chile;Department of Electrical Engineering, Universidad de Chile, Chile

  • Venue:
  • CIARP'06 Proceedings of the 11th Iberoamerican conference on Progress in Pattern Recognition, Image Analysis and Applications
  • Year:
  • 2006

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Abstract

This paper proposes an improvement over the traditional SIFT-based object recognition methodology proposed by Lowe [3]. This improvement corresponds to a fast probabilistic model for hypothesis rejection (affine solution verification stage), which allows a large reduction in the number of false positives. The new probabilistic model is evaluated in an object recognition task using a database of 100 pairs of images.