S_Kernel: a new symmetry measure

  • Authors:
  • Vito Di Gesù;Bertrand Zavidovique

  • Affiliations:
  • DMA, Università di Palermo, Italy;IEF, University of Paris XI, ORSAY, France

  • Venue:
  • PReMI'05 Proceedings of the First international conference on Pattern Recognition and Machine Intelligence
  • Year:
  • 2005

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Abstract

Symmetry is an important feature in vision. Several detectors or transforms have been proposed. In this paper we concentrate on a measure of symmetry. Given a transform S, the kernel SK of a pattern is defined as the maximal included symmetric sub-set of this pattern. It is easily proven that, in any direction, the optimal axis corresponds to the maximal correlation of a pattern with its flipped version. For the measure we compute a modified difference between respective surfaces of a pattern and its kernel. That founds an efficient algorithm to attention focusing on symmetric patterns.