On simultaneous selection of prototypes and features in large data

Authors:
T. Ravindra Babu;M. Narasimha Murty;V. K. Agrawal
Affiliations:
Department of Computer Science and Automation, Indian Institute of Science, Bangalore, India;Department of Computer Science and Automation, Indian Institute of Science, Bangalore, India;ISRO Satellite Centre, Bangalore, India
Venue:
PReMI'05 Proceedings of the First international conference on Pattern Recognition and Machine Intelligence
Year:
2005

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Abstract

In dealing with high-dimensional, large data, for the sake of abstract generation one resorts to either dimensionality reduction or cluster the patterns and deal with cluster representatives or both. The current paper examines whether there exists an equivalence in terms of generalization error. Four different approaches are followed and results of exercises are provided in driving home the issues involved.