A statistical evaluation model for minutiae-based automatic fingerprint verification systems

Authors:
J. S. Chen;Y. S. Moon
Affiliations:
Department of Computer Science and Engineering, The Chinese University of Hong Kong, Shatin, N. T., Hong Kong;Department of Computer Science and Engineering, The Chinese University of Hong Kong, Shatin, N. T., Hong Kong
Venue:
ICB'06 Proceedings of the 2006 international conference on Advances in Biometrics
Year:
2006

Citing 2
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Abstract

Evaluation of the reliability of an Automatic Fingerprint Verification System (AFVS) is usually performed by applying it to a fingerprint database to get the verification accuracy. However, such an evaluation process might be quite time consuming especially for big fingerprint databases. This may prolong the developing cycles of AFVSs and thus increase the cost. Also, comparison of the reliability of different AFVSs may be unfair if different fingerprint databases are used. In this paper, we propose a solution to solve these problems by creating an AFVS evaluation model which can be used for verification accuracy prediction and fair reliability comparison. Experimental results show that our model can predict the performance of a real AFVS pretty satisfactorily.