Robust active appearance model matching

Authors:
Reinhard Beichel;Horst Bischof;Franz Leberl;Milan Sonka
Affiliations:
Institute for Computer Graphics and Vision, Graz University of Technology, Graz, Austria;Institute for Computer Graphics and Vision, Graz University of Technology, Graz, Austria;Institute for Computer Graphics and Vision, Graz University of Technology, Graz, Austria;Department of Electrical and Computer Engineering, The University of Iowa, Iowa City, IA
Venue:
IPMI'05 Proceedings of the 19th international conference on Information Processing in Medical Imaging
Year:
2005

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Abstract

A novel robust active appearance model (AAM) matching algorithm is presented. The method consists of two main stages. First, initial residuals are clustered by a non parametric mean shift mode detection step. Second, modes without gross outliers are selected using an objective function. Robustness of the matching procedure is demonstrated on a variety of examples with different noise conditions. The proposed algorithm outperformed the conventional AAM matching on images with gross disturbances and can tolerate up to 40% of disturbed data.