Leather inspection based on wavelets

  • Authors:
  • João Luís Sobral

  • Affiliations:
  • Departamento de Informática, Universidade do Minho, Braga, Portugal

  • Venue:
  • IbPRIA'05 Proceedings of the Second Iberian conference on Pattern Recognition and Image Analysis - Volume Part II
  • Year:
  • 2005

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Abstract

This paper presents a new methodology to detect leather defects, based on the wavelet transform. The methodology uses a bank of optimised filters, where each filter is tuned to one defect type. Filter shape and wavelet sub-band are selected based the maximisation of the ratio between features values on defect regions and on normal regions. The proposed methodology can detect defects even when small features variations are present, which are not detect by generic texture classification techniques, and is fast enough to be used for real-time leather inspection.