Improved algorithms for largest cardinality 2-interval pattern problem

  • Authors:
  • Hao Yuan;Linji Yang;Erdong Chen

  • Affiliations:
  • Department of Computer Science and Engineering, Shanghai Jiao Tong University, Shanghai, P.R. China;Department of Computer Science and Engineering, Shanghai Jiao Tong University, Shanghai, P.R. China;Department of Computer Science and Engineering, Shanghai Jiao Tong University, Shanghai, P.R. China

  • Venue:
  • ISAAC'05 Proceedings of the 16th international conference on Algorithms and Computation
  • Year:
  • 2005

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Abstract

The 2-Interval Pattern problem is to find the largest constrained pattern in a set of 2-intervals. The constrained pattern is a subset of the given 2-intervals such that any pair of them are R-comparable, where model $R \subseteq \{O(dn)=O(n2) is the total length of all 2-intervals (density d is the maximum number of 2-intervals over any point). This improves previous O(n2log n) algorithm. Secondly, we use dynamic programming techniques to obtain an O(n log n + dn) algorithm for the case $R = \{ O(n2) result. Finally, we present another $O(n {\rm log} n + \mathcal{L})$ algorithm for the case $R = \{\sqsubset, \between\}$ with disjoint support(interval ground set), which improves previous $O(n^{2}\sqrt{n})$ upper bound.