Fractal dimension analysis and statistical processing of paper surface images towards surface roughness measurement

Authors:
Toni Kuparinen;Oleg Rodionov;Pekka Toivanen;Jarno Mielikainen;Vladimir Bochko;Ate Korkalainen;Juha Parviainen;Erik Vartiainen
Affiliations:
Department of Information Technology;Department of Information Technology;Department of Information Technology;Department of Information Technology;Department of Information Technology;Laboratory of Physics, Lappeenranta University of Technology, Lappeenranta, Finland;Laboratory of Physics, Lappeenranta University of Technology, Lappeenranta, Finland;Laboratory of Physics, Lappeenranta University of Technology, Lappeenranta, Finland
Venue:
SCIA'05 Proceedings of the 14th Scandinavian conference on Image Analysis
Year:
2005

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Abstract

In this paper we present a method for optical paper surface roughness measurement, which overcomes the disadvantages of the traditional methods. Airflow-based roughness measurement methods and profilometer require expensive special equipment, essential laboratory conditions, are contact-based and slow and unsuitable for on-line control purposes methods. We employed an optical microscope with a built-in CCD-camera to take images of paper surface. The obtained image is considered as a texture. We applied statistical brightness measures and fractal dimension analysis for texture analysis. We have found a strong correlation between the roughness and a fractal dimension. Our method is non-contact–based, fast and is suitable for on-line control measurements in the paper industry.