Predicting melting temperature (tm) of DNA duplex based on neural network

Authors:
Xiangrong Liu;Wenbin Liu;Juan Liu;Linqiang Pan;Jin Xu
Affiliations:
Research Institute of biomolecular Computer, Huazhong University of Science and Technology, Wuhan City, China;School of Computer Science and Engineering, Wenzhou Normal College, Wenzhou City, China;The Department of Electronic Science and Technology, Huazhong University of Science and Technology, Wuhan City, China;Research Institute of biomolecular Computer, Huazhong University of Science and Technology, Wuhan City, China;Research Institute of biomolecular Computer, Huazhong University of Science and Technology, Wuhan City, China
Venue:
ICIC'06 Proceedings of the 2006 international conference on Computational Intelligence and Bioinformatics - Volume Part III
Year:
2006

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Abstract

In DNA computing, similar thermodynamic stability of the encoding DNA sequences is conduced to improve the reliability and precision of the computing process. The melting temperature is a suitable parameter used to evaluating the stability of DNA duplex. Traditional method to predict Tm in biological engineering may exist lager error for a few sequences. Thus it misfits the lager amount of DNA sequences in DNA computing. In this paper, we introduced artificial neural network to predict the Tm based on Next-Nearest-Neighbor model. Our result shows that the methods have a higher precision than TP methods based on nearest-neighbor model.