A new LUT watermarking scheme with near minimum distortion based on the statistical modeling in the wavelet domain

Authors:
Kan Li;Xiao-Ping Zhang
Affiliations:
Department of Electrical and Computer Engineering, Ryerson University, Toronto, Ontario, Canada;Department of Electrical and Computer Engineering, Ryerson University, Toronto, Ontario, Canada
Venue:
ICIC'05 Proceedings of the 2005 international conference on Advances in Intelligent Computing - Volume Part II
Year:
2005

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Abstract

This paper presents a new wavelet domain look-up table (LUT) watermarking algorithm that leads to the sub-optimal embedding of watermarks in the sense of minimizing distortion. The algorithm provides a joint distortion-robustness design of the LUT based watermark. There are two key features in the algorithm: (1) a near minimum-distortion LUT with the maximum run of 2 is designed based on the statistical properties of the wavelet coefficients; (2) an expectation-maximization (EM) algorithm based method is employed to model the statistical distribution of wavelet coefficients and select significant coefficients (coefficients with large magnitude) for watermark embedding. The experimental results show that images watermarked by the proposed algorithm have about 1.5-2.5dB peak-signal-to-noise-ratio (PSNR) gain over the conventional odd-even embedding method, while the system presents great robustness. In the case of 0.2bpp (1/40) JPEG2000 compression, the proposed scheme can ensure a reasonably low bit error rate (BER).