Testing COM components using software fault injection and mutation analysis, and its empirical study

Authors:
Hoijin Yoon;Eunhee Kim;Joo Young Seo;Byoungju Choi
Affiliations:
College of Computing, Georgia Institute of Technology;Software Center, Samsung Electronics Co. Ltd, Korea;Department of Computer Science and Engineering, Ewha Women's University, Korea;Department of Computer Science and Engineering, Ewha Women's University, Korea
Venue:
FATES'04 Proceedings of the 4th international conference on Formal Approaches to Software Testing
Year:
2004

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Abstract

CBSD needs to customize and compose components. Customization and composition can cause faults which are hard to detect by existing testing techniques, since components have different structures from traditional programs. This paper proposes a testing technique for customization and composition, and then it tailors the technique to COM component architecture. Since CBSD aims to reduce development cost, testing should consider the cost of testing. Effective test data will help reduce testing cost. Therefore, an empirical study shows that the technique proposed in this paper selects effective test data.