Three-round adaptive diagnosis in binary n-cubes

  • Authors:
  • Satoshi Fujita;Toru Araki

  • Affiliations:
  • Department of Information Engineering, Graduate School of Engineering, Hiroshima University;Department of Computer and Information Sciences, Faculty of Engineering, Iwate University

  • Venue:
  • ISAAC'04 Proceedings of the 15th international conference on Algorithms and Computation
  • Year:
  • 2004

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Abstract

In this paper, we consider the problem of adaptive fault-diagnosis in binary n-cubes, and propose a scheme that completes a diagnosis in at most three test rounds, provided that n ≥ 3 and the number of faulty vertices is at most n The proposed scheme is optimal in the sense that: 1) three rounds are necessary for the adaptive diagnosis, 2) there exists a set of n + 1 faulty vertices that can not be located by any diagnosis scheme, and 3) to identify n faulty vertices, the system must contain at least 2n + 1 vertices Note that n = 3 is the smallest integer satisfying 2n ≥ 2n + 1.