Machine Learning
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IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence
Machine Learning
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ICML '97 Proceedings of the Fourteenth International Conference on Machine Learning
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The Journal of Machine Learning Research
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The Journal of Machine Learning Research
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An Analysis of Ensemble Pruning Techniques Based on Ordered Aggregation
IEEE Transactions on Pattern Analysis and Machine Intelligence
On a New Measure of Classifier Competence Applied to the Design of Multiclassifier Systems
ICIAP '09 Proceedings of the 15th International Conference on Image Analysis and Processing
ISBMDA'06 Proceedings of the 7th international conference on Biological and Medical Data Analysis
A survey of multiple classifier systems as hybrid systems
Information Fusion
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In this paper, a measure of competence based on random classification (MCR) for classifier ensembles is presented. The measure selects dynamically (i.e. for each test example) a subset of classifiers from the ensemble that perform better than a random classifier. Therefore, weak (incompetent) classifiers that would adversely affect the performance of a classification system are eliminated. When all classifiers in the ensemble are evaluated as incompetent, the classification accuracy of the system can be increased by using the random classifier instead. Theoretical justification for using the measure with the majority voting rule is given. Two MCR based systems were developed and their performance was compared against six multiple classifier systems using data sets taken from the UCI Machine Learning Repository and Ludmila Kuncheva Collection. The systems developed had typically the highest classification accuracies regardless of the ensemble type used (homogeneous or heterogeneous).