A new maximum-relevance criterion for significant gene selection

  • Authors:
  • Young Bun Kim;Jean Gao;Pawel Michalak

  • Affiliations:
  • Department of Computer Science and Engineering;Department of Computer Science and Engineering;Department of Biology, The University of Texas, Arlington, TX

  • Venue:
  • PRIB'06 Proceedings of the 2006 international conference on Pattern Recognition in Bioinformatics
  • Year:
  • 2006

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Abstract

Gene (feature) selection has been an active research area in microarray analysis. Max-Relevance is one of the criteria which has been broadly used to find features largely correlated to the target class. However, most approximation methods for Max-Relevance do not consider joint effect of features on the target class. We propose a new Max-Relevance criterion which combines the collective impact of the most expressive features in Emerging Patterns (EPs) and some popular independent criteria such as t-test and symmetrical uncertainty. The main benefit of this criterion is that by capturing the joint effect of features using EPs algorithm, it finds the most discriminative features in a broader scope. Experiment results clearly demonstrate that our feature sets improve the class prediction comparing to other feature selections.