LEIRIOS test generator: automated test generation from b models

  • Authors:
  • Eddie Jaffuel;Bruno Legeard

  • Affiliations:
  • LEIRIOS Technologies, TEMIS Innovation, Besançon, France;,EIRIOS Technologies, TEMIS Innovation, Besançon, France

  • Venue:
  • B'07 Proceedings of the 7th international conference on Formal Specification and Development in B
  • Year:
  • 2007

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Abstract

Since 2003, automated test generation from B abstract machines has been trying out in the smart card industry, using LEIRIOS Test Generator (LTG) for SmartCard tool. Now the major card manufacturers, such as Gemalto and Giesecke & Devrient, are regularly deploying model-based testing in their validation processes. The purpose is black-box functional testing: from the specifications (a standard or specific requirements), a B formal model is developed which is the basis for test generation. Generated test cases are then translated into executable test scripts and then run on the application.