ONTO-EVOAL an ontology evolution approach guided by pattern modeling and quality evaluation

Authors:
Rim Djedidi;Marie-Aude Aufaure
Affiliations:
Computer Science Department, Supélec Campus de Gif, Plateau du Moulon, Gif sur Yvette Cedex, France;MAS Laboratory, SAP Business Object Chair –Centrale Paris, Grande Voie des Vignes, Châtenay-Malabry Cedex, France
Venue:
FoIKS'10 Proceedings of the 6th international conference on Foundations of Information and Knowledge Systems
Year:
2010

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Abstract

In this paper, we present a generic ontology evolution approach guided by a pattern-oriented process and a quality evaluation activity. Pattern modeling aims to drive and control change application while maintaining consistency of the evolved ontology. Evaluation activity –supported by an ontology quality model– is used to guide inconsistency resolution by assessing the impact of resolution alternatives –proposed by the evolution process- on ontology quality and selecting the resolution that preserves the quality of the evolved ontology.