A multi-scale bilateral structure tensor based corner detector

Authors:
Lin Zhang;Lei Zhang;David Zhang
Affiliations:
Biometrics Research Center, Department of Computing, The Hong Kong Polytechnic University, Hong Kong, China;Biometrics Research Center, Department of Computing, The Hong Kong Polytechnic University, Hong Kong, China;Biometrics Research Center, Department of Computing, The Hong Kong Polytechnic University, Hong Kong, China
Venue:
ACCV'09 Proceedings of the 9th Asian conference on Computer Vision - Volume Part II
Year:
2009

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Abstract

In this paper, a novel multi-scale nonlinear structure tensor based corner detection algorithm is proposed to improve effectively the classical Harris corner detector. By considering both the spatial and gradient distances of neighboring pixels, a nonlinear bilateral structure tensor is constructed to examine the image local pattern. It can be seen that the linear structure tensor used in the original Harris corner detector is a special case of the proposed bilateral one by considering only the spatial distance. Moreover, a multi-scale filtering scheme is developed to tell the trivial structures from true corners based on their different characteristics in multiple scales. The comparison between the proposed approach and four representative and state-of-the-art corner detectors shows that our method has much better performance in terms of both detection rate and localization accuracy.