Adaptation of SIFT features for robust face recognition

Authors:
Janez Križaj;Vitomir Štruc;Nikola Pavešić
Affiliations:
Faculty of Electrical Engineering, University of Ljubljana, Ljubljana, Slovenia;Faculty of Electrical Engineering, University of Ljubljana, Ljubljana, Slovenia;Faculty of Electrical Engineering, University of Ljubljana, Ljubljana, Slovenia
Venue:
ICIAR'10 Proceedings of the 7th international conference on Image Analysis and Recognition - Volume Part I
Year:
2010

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Abstract

The Scale Invariant Feature Transform (SIFT) is an algorithm used to detect and describe scale-, translation- and rotation-invariant local features in images. The original SIFT algorithm has been successfully applied in general object detection and recognition tasks, panorama stitching and others. One of its more recent uses also includes face recognition, where it was shown to deliver encouraging results. SIFT-based face recognition techniques found in the literature rely heavily on the so-called keypoint detector, which locates interest points in the given image that are ultimately used to compute the SIFT descriptors. While these descriptors are known to be among others (partially) invariant to illumination changes, the keypoint detector is not. Since varying illumination is one of the main issues affecting the performance of face recognition systems, the keypoint detector represents the main source of errors in face recognition systems relying on SIFT features. To overcome the presented shortcoming of SIFT-based methods, we present in this paper a novel face recognition technique that computes the SIFT descriptors at predefined (fixed) locations learned during the training stage. By doing so, it eliminates the need for keypoint detection on the test images and renders our approach more robust to illumination changes than related approaches from the literature. Experiments, performed on the Extended Yale B face database, show that the proposed technique compares favorably with several popular techniques from the literature in terms of performance.