Face image retrieval based on probe sketch using SIFT feature descriptors

Authors:
Rakesh S.;Kailash Atal;Ashish Arora;Pulak Purkait;Bhabatosh Chanda
Affiliations:
Dept. of Computer Science, National Institute of Technology Karnataka, Surathkal, India;Department of EEE, IIT Guwahati, Guwahati, India;Department of EEE, IIT Guwahati, Guwahati, India;ECSU, Indian Statistical Institute, Kolkata, India;ECSU, Indian Statistical Institute, Kolkata, India
Venue:
PerMIn'12 Proceedings of the First Indo-Japan conference on Perception and Machine Intelligence
Year:
2012

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Abstract

This paper presents a feature-based method for matching facial sketch images to face photographs. Earlier approaches calculated descriptors over the whole image and used some transformation and matched them by some classifiers. We present an idea, where descriptors are calculated at selected discrete points (eyes, nose, ears…). This allows us to compare only prominent features. We use SIFT (Scale Invariant Feature Transform) to extract feature descriptors at the annotated points in the sketches and experiment with various methods to retrieve photos. Experimental results demonstrate appreciable matching performances using the presented feature-based methods at a low computational cost.