BEST: A symbolic testing tool for predicting multi-threaded program failures

  • Authors:
  • Malay K. Ganai;Nipun Arora;Chao Wang;Aarti Gupta;Gogul Balakrishnan

  • Affiliations:
  • NEC Labs America, Princeton, USA;Columbia University, New York, USA;NEC Labs America, Princeton, USA;NEC Labs America, Princeton, USA;NEC Labs America, Princeton, USA

  • Venue:
  • ASE '11 Proceedings of the 2011 26th IEEE/ACM International Conference on Automated Software Engineering
  • Year:
  • 2011

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Abstract

We present a tool BEST (Binary instrumentation-based Error-directed Symbolic Testing) for predicting concurrency violations.