Automated documentation inference to explain failed tests

Authors:
Sai Zhang; Cheng Zhang;Michael D. Ernst
Affiliations:
University of Washington, USA;Shanghai Jiao Tong University, China;University of Washington, USA
Venue:
ASE '11 Proceedings of the 2011 26th IEEE/ACM International Conference on Automated Software Engineering
Year:
2011

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Abstract

A failed test reveals a potential bug in the tested code. Developers need to understand which parts of the test are relevant to the failure before they start bug-fixing.