A performance study of some transient detectors

  • Authors:
  • Zhen Wang;P. Willett

  • Affiliations:
  • Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT;-

  • Venue:
  • IEEE Transactions on Signal Processing
  • Year:
  • 2000

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Abstract

We present a simulation study of several different statistics applied to the detection of unknown transient signals in white Gaussian noise. The results suggest that relatively unsophisticated tests based on temporal localization of power, such as the Page (1954) test and a test based on a new statistic due to Nuttall (see NUWC-NPT Tech. Rep. 11123, 1996, and NUWC-NPT Tech. Rep. 10822, 1997), give reliable results