Structured least squares problems and robust estimators
IEEE Transactions on Signal Processing
An illumination invariant face recognition approach using exemplar-based synthesis technique
CAIP'05 Proceedings of the 11th international conference on Computer Analysis of Images and Patterns
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The least squares (LS) estimation criterion on one hand, and the total LS (TLS), constrained TLS (CTLS) and structured TLS (STLS) criteria on the other hand, can be viewed as opposite limiting cases of a more general criterion, which we term “extended LS” (XLS). The XLS criterion distinguishes measurement errors from modeling errors by properly weighting and balancing the two error sources. In the context of certain models (termed “pseudo-linear”), we derive two iterative algorithms for minimizing the XLS criterion: One is a straightforward “alternating coordinates” minimization, and the other is an extension of an existing CTLS algorithm. The algorithms exhibit different tradeoffs between convergence rate, computational load, and accuracy. The XLS criterion can be applied to popular estimation problems, such as identifying an autoregressive (AR) with exogenous noise (ARX) system from noisy input/output measurements or estimating the parameters of an AR process from noisy measurements. We demonstrate the convergence properties and performance of the algorithms with examples of the latter