Complex system verification (panel): the challenge ahead

  • Authors:

  • Ron Collett;Ken McMillan;Alberto Sangiovanni-Vincentelli;Martin Baynes;Naeem Zafar;Steve Sapiro;Johan Van Ginderdeuren;Stephen Ricca

  • Affiliations:

  • Collett International, Inc., Santa Clara, CA;AT&T Bell Labs., Murray Hill, NJ;Vincentelli - Univ. of California, Berkeley, CA;Zycad Corp., Fremont, CA;Quickturn Design Systems, Mountain View, CA;Intel Corp., Hillsboro, OR;Philips ITCL, Leuven, Belgium;Rockwell/CMC, Santa Barbara, CA

  • Venue:
  • DAC '94 Proceedings of the 31st annual Design Automation Conference
  • Year:
  • 1994

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Abstract