Fault diagnosis of electronic systems using intelligent techniques: a review

  • Authors:
  • W. G. Fenton;T. M. McGinnity;L. P. Maguire

  • Affiliations:
  • Fac. of Informatics, Univ. of Ulster, Derry;-;-

  • Venue:
  • IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews
  • Year:
  • 2001

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Abstract

In an increasingly competitive marketplace system complexity continues to grow, but time-to-market and lifecycle are reducing. The purpose of fault diagnosis is the isolation of faults on defective systems, a task requiring a high skill set. This has driven the need for automated diagnostic tools. Over the last two decades, automated diagnosis has been an active research area, but the industrial acceptance of these techniques, particularly in cost-sensitive areas, has not been high. This paper reviews this research, primarily covering rule-based, model-based, and case-based approaches and applications. Future research directions are finally examined, with a concentration on issues, which may lead to a greater acceptance of automated diagnosis