Dependability evaluation of complex embedded systems and microsystems

Authors:
O. Malassé;G. Buchheit;K. Hamidi;M. Pock;H. Belhadaoui;M. Walter;J F. Aubry
Affiliations:
A3SI, Arts et Métiers ParisTech, Metz cedex;A3SI, Arts et Métiers ParisTech, Metz cedex;A3SI, Arts et Métiers ParisTech, Metz cedex;A3SI, Arts et Métiers ParisTech, Metz cedex;A3SI, Arts et Métiers ParisTech, Metz cedex;LRR, TU-München, Institut für Informatik, Garching bei München;-
Venue:
VECoS'09 Proceedings of the Third international conference on Verification and Evaluation of Computer and Communication Systems
Year:
2009

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Abstract

The evaluation of the dependability performance (Reliability, Availability, Maintainability and Safety-RAMS) of complex embedded systems requires the development of new approaches. In software-intensive systems, the dependability structure of the functions depends on the software. The search of fault sequences must involve software and hardware. The proposed method contributes to the qualitative and quantitative safety analysis of systems and micro-systems.