A Bayesian approach to the Hough transform for line detection

Authors:
A. Bonci;T. Leo;S. Longhi
Affiliations:
Dipt. di Ingegneria Informatica, Univ. Politecnica delle Marche, Ancona, Italy;-;-
Venue:
IEEE Transactions on Systems, Man, and Cybernetics, Part A: Systems and Humans
Year:
2005

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Abstract

This paper explains how to associate a rigorous probability value to the main straight line features extracted from a digital image. A Bayesian approach to the Hough Transform (HT) is considered. Under general conditions, it is shown that a probability measure is associated to each line extracted from the HT. The proposed method increments the HT accumulator in a probabilistic way: first calculating the uncertainty of each edge point in the image and then using a Bayesian probabilistic scheme for fusing the probability of each edge point and calculating the line feature probability.