Volumetric segmentation using Weibull E-SD fields

Authors:
Jiuxiang Hu;A. Razdan;G. M. Nielson;G. E. Farin;D. P. Baluch;D. G. Capco
Affiliations:
Arizona State Univ., Tempe, AZ, USA;-;-;-;-;-
Venue:
IEEE Transactions on Visualization and Computer Graphics
Year:
2003

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Abstract

This paper presents a coarse-grain approach for segmentation of objects with gray levels appearing in volume data. The input data is on a 3D structured grid of vertices v(i. j. k), each associated with a scalar value. In this paper, we consider a voxel as a κ × κ × κ cube and each voxel is assigned two values: expectancy and standard deviation (E-SD). We use the Weibull noise index to estimate the noise in a voxel and to obtain more precise E-SD values for each voxel. We plot the frequency of voxels which have the same E-SD, then 3D segmentation based on the Weibull E-SD field is presented. Our test bed includes synthetic data as well as real volume data from a confocal laser scanning microscope (CLSM). Analysis of these data all show distinct and defining regions in their E-SD fields. Under the guide of the E-SD field, we can efficiently segment the objects embedded in real and simulated 3D data.