Technical Communique: Optimal closed-loop identification test design for internal model control

  • Authors:

  • Yucai Zhu;Paul P. J. Van Den Bosch

  • Affiliations:

  • Faculty of Electrical Engineering, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, Netherlands;Faculty of Electrical Engineering, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, Netherlands

  • Venue:
  • Automatica (Journal of IFAC)
  • Year:
  • 2000

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Abstract

In this work, optimal closed-loop test design for control is studied. Simple design formulas are derived based on the asymptotic theory of Ljung. The control scheme used is internal model control (IMC) and the design constraint is the power of the process output or that of the reference signal. The test signal is applied at the setpoint. The results give clear guidelines for closed-loop identification applications.