Positive-realness analysis of sampled-data systems and its applications

  • Authors:

  • Tomomichi Hagiwara;Toru Mugiuda

  • Affiliations:

  • Department of Electrical Engineering, Kyoto University, Kyotodaigaku-Katsura, Nishikyo-ku, Kyoto 615-8510, Japan;Department of Electrical Engineering, Kyoto University, Kyotodaigaku-Katsura, Nishikyo-ku, Kyoto 615-8510, Japan

  • Venue:
  • Automatica (Journal of IFAC)
  • Year:
  • 2004

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Abstract

In this paper, we first study strong positive-realness of sampled-data systems and introduce a measure called positive-realness gap index. We show that this index can be computed efficiently with a bisection method, and provide state space formulas for its computation. The importance of this index lies in that it is useful for robust stability analysis of sampled-data systems. An iterative procedure for computing an exact robust stability margin is given and illustrated through a numerical example.