White box classification of dissimilarity data

  • Authors:
  • Barbara Hammer;Bassam Mokbel;Frank-Michael Schleif;Xibin Zhu

  • Affiliations:
  • CITEC Centre of Excellence, Bielefeld University, Bielefeld, Germany;CITEC Centre of Excellence, Bielefeld University, Bielefeld, Germany;CITEC Centre of Excellence, Bielefeld University, Bielefeld, Germany;CITEC Centre of Excellence, Bielefeld University, Bielefeld, Germany

  • Venue:
  • HAIS'12 Proceedings of the 7th international conference on Hybrid Artificial Intelligent Systems - Volume Part I
  • Year:
  • 2012

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Abstract

While state-of-the-art classifiers such as support vector machines offer efficient classification for kernel data, they suffer from two drawbacks: the underlying classifier acts as a black box which can hardly be inspected by humans, and non-positive definite Gram matrices require additional preprocessing steps to arrive at a valid kernel. In this approach, we extend prototype-based classification towards general dissimilarity data resulting in a technology which (i) can deal with dissimilarity data characterized by an arbitrary symmetric dissimilarity matrix, (ii) offers intuitive classification in terms of prototypical class representatives, and (iii) leads to state-of-the-art classification results.