Surrogate measures of thickness in the regime of limited image resolution: part 2: granulometry

  • Authors:

  • Zbisław Tabor;Rafał Petryniak

  • Affiliations:

  • Cracow University of Technology, Cracow, Poland;Cracow University of Technology, Cracow, Poland

  • Venue:
  • ICAISC'12 Proceedings of the 11th international conference on Artificial Intelligence and Soft Computing - Volume Part II
  • Year:
  • 2012

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Abstract

In the present study a granulometry-based method of computing surrogate measure of thickness from gray-level images is introduced. Using Bland-Altman analysis it is demonstrated for a set of 25 μCT images that the difference between surrogate and reference measures of thickness corresponds to some non-zero bias. Analytical formulas derived in this study identify conditions necessary for the equality of surrogate measures of thickness and real thickness. The performance of the proposed method in the presence of image degradation factors (resolution decrease and noise) is tested.