Software reliability assessment models based on cumulative bernoulli trial processes

  • Authors:

  • Tadashi Dohi;Keiichi Yasui;Shunji Osaki

  • Affiliations:

  • Department of Industrial and Systems Engineering Hiroshima University, Higashi-Hiroshima, Japan;Department of Industrial and Systems Engineering Hiroshima University, Higashi-Hiroshima, Japan;Department of Information and Communication Engineering Nanzan University, Seto, Japan

  • Venue:
  • Mathematical and Computer Modelling: An International Journal
  • Year:
  • 2003

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Abstract

The binomial software reliability growth model (SRGM) contains most existing SRGMs proposed in earlier work as special cases, and can describe every software failure-occurrence pattern in continuous time. In this paper, we propose generalized binomial SRGMs in both continuous and discrete time, based on the idea of cumulative Bernoulli trials. It is shown that the proposed models give some new unusual discrete models as well as the well-known continuous SRGMs. Through numerical examples with actual software failure data, two estimation methods for model parameters with grouped data are provided, and the predictive model performance is examined quantitatively.