On error exponents of modulo lattice additive noise channels

Authors:
T. Liu;P. Moulin;R. Koetter
Affiliations:
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA;-;-
Venue:
IEEE Transactions on Information Theory
Year:
2006

Citing 0
Cited 2

Joint Wyner-Ziv/dirty-paper coding by modulo-lattice modulation

IEEE Transactions on Information Theory
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Abstract

Modulo lattice additive noise (MLAN) channels appear in the analysis of structured binning codes for Costa's dirty-paper channel and of nested lattice codes for the additive white Gaussian noise (AWGN) channel. In this paper, we derive a new lower bound on the error exponents of the MLAN channel. With a proper choice of the shaping lattice and the scaling parameter, the new lower bound coincides with the random-coding lower bound on the error exponents of the AWGN channel at the same signal-to-noise ratio (SNR) in the sphere-packing and straight-line regions. This result implies that, at least for rates close to channel capacity, 1) writing on dirty paper is as reliable as writing on clean paper; and 2) lattice encoding and decoding suffer no loss of error exponents relative to the optimal codes (with maximum-likelihood decoding) for the AWGN channel.