A similarity metric for edge images

Authors:
M. S. Prieto;A. R. Allen
Affiliations:
Sch. of Eng. & Phys. Sci., Univ. of Aberdeen, UK;-
Venue:
IEEE Transactions on Pattern Analysis and Machine Intelligence
Year:
2003

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Abstract

The performance of several discrepancy measures for the comparison of edge images is analyzed and a novel similarity metric aimed at overcoming their problems is proposed. The algorithm finds an optimal matching of the pixels between the images and estimates the error produced by this matching. The resulting Pixel Correspondence Metric (PCM) can take into account edge strength as well as the displacement of edge pixel positions in the estimation of similarity. A series of experimental tests shows the new metric to be a robust and effective tool in the comparison of edge images when a small localization error of the detected edges is allowed.