Automated Visual Inspection: A Survey

Authors:
Roland T. Chin;Charles A. Harlow
Affiliations:
MEMBER, IEEE, Department ot Electrical and Computer Engineering, University of Wisconsin, Madison, WI 53706.;-
Venue:
IEEE Transactions on Pattern Analysis and Machine Intelligence
Year:
1982

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Abstract

This paper surveys publications, reports, and articles dealing with automated visual inspection for industry. The references are organized according to their contents: overview and discussions, rationales, components and design considerations, commercially available systems, applications. A number of applications and their inspection methodologies are discussed in detail: the inspection of printed circuit boards, photomasks, integrated circuit chips. Other inspection applications are listed as a bibliography. A list of selectively annotated references in commercially available visual inspection tools is also included.