Probabilistic design of integrated circuits with correlated input parameters

  • Authors:

  • A. Seifi;K. Ponnambalam;J. Vlach

  • Affiliations:

  • Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.;-;-

  • Venue:
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Year:
  • 2006

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Abstract

This paper presents an application of advanced first-order second-moment (AFOSM) reliability method to probabilistic design of integrated circuits with correlated parameters. The method avoids the transformation to the space of uncorrelated parameters and provides a conservative estimate of the yield. Optimal nominal values are found such that the cost of tolerances is minimized while the desired yield is achieved. Numerical results are presented for a switched capacitor filter and verified by Monte Carlo simulation