A reconfigurable voltage reference without resistors
KES'10 Proceedings of the 14th international conference on Knowledge-based and intelligent information and engineering systems: Part IV
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
A Fast Non-Monte-Carlo Yield Analysis and Optimization by Stochastic Orthogonal Polynomials
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Hi-index | 0.03 |
In this paper a simulator for the statistical analysis of analog CMOS integrated circuits affected by technological tolerance effects, including device mismatch, is presented. The tool, able to perform dc, ac, and transient analyses, is based on a rigorous formulation of circuit equations starting from the modified nodal analysis and including random current sources to take into account technological tolerances. Statistical simulation of specific circuits shows that the simulator requires a simulation time several orders of magnitude lower than that required by Monte Carlo analysis, while ensuring a good accuracy.