Introduction to statistical pattern recognition (2nd ed.)
Introduction to statistical pattern recognition (2nd ed.)
Statistical Pattern Recognition: A Review
IEEE Transactions on Pattern Analysis and Machine Intelligence
Fractional-Step Dimensionality Reduction
IEEE Transactions on Pattern Analysis and Machine Intelligence
Multiclass Linear Dimension Reduction by Weighted Pairwise Fisher Criteria
IEEE Transactions on Pattern Analysis and Machine Intelligence
Pattern Classification (2nd Edition)
Pattern Classification (2nd Edition)
Linear Dimensionality Reduction via a Heteroscedastic Extension of LDA: The Chernoff Criterion
IEEE Transactions on Pattern Analysis and Machine Intelligence
Computational Statistics & Data Analysis
Bayes Optimality in Linear Discriminant Analysis
IEEE Transactions on Pattern Analysis and Machine Intelligence
On the minimal dimension of sufficient statistics
IEEE Transactions on Information Theory
The C-loss function for pattern classification
Pattern Recognition
Review article: Computational intelligence techniques in bioinformatics
Computational Biology and Chemistry
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Classification of high-dimensional data typically requires extraction of discriminant features. This paper proposes a linear feature extractor, called whitened linear sufficient statistic (WLSS), which is based on the sufficiency conditions for heteroscedastic Gaussian distributions. WLSS approximates, in the least squares sense, an operator providing a sufficient statistic. The proposed method retains covariance discriminance in heteroscedastic data, while it reduces to the commonly used linear discriminant analysis (LDA) in the homoscedastic case. Compared to similar heteroscedastic methods, WLSS imposes a low computational complexity, and is highly generalizable as confirmed by its consistent competence over various data sets.