Failure detection processes by an expert system and hybrid pattern recognition

Authors:
L.F Pau
Affiliations:
Battelle Memorial Institute, 7 route de Drize, CH-1227 Carouge, Switzerland
Venue:
Pattern Recognition Letters
Year:
1984

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Abstract

This paper describes the architecture of a failure diagnosis system, as used in automatic testing, automatic imaging inspection, and specific failure detection tasks in electronics. A new knowledge representation scheme is also given, in relation to hybrid pattern recognition rules. Current work on building a knowledge base of diagnostic metarules is mentioned.