An optimal group testing algorithm on k disjoint sets

  • Authors:

  • J.F Weng;F.K Hwang

  • Affiliations:

  • School of Information, Science and Technology, The Flinders University, Bedford Park, SA 5042, Australia;AT&T Bell Laboratories, Murray Hill, NJ 07974, USA

  • Venue:
  • Operations Research Letters
  • Year:
  • 1993

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Abstract

Chang and Hwang proved that for two disjoint sets with m and n items each containing exactly one defective, there exists a group testing algorithm to identify all defectives in [log"2mn] tests - the information lower bound. They also showed that a similar result does not hold for k disjoint sets in general for any k = 3. In this paper we show that for each k there exist k disjoint sets each containing exactly one defective such that all defectives can be identified in the information lower bound number of tests.