On the robustness of batching estimators

  • Authors:
  • Yingchieh Yeh;Bruce Schmeiser

  • Affiliations:
  • Department of Business Administration, Yuan Ze University, Taoyuan, Taiwan;School of Industrial Engineering, Purdue University, West Lafayette, IN 47907-2023, USA

  • Venue:
  • Operations Research Letters
  • Year:
  • 2004

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Abstract

We propose and investigate an alternative definition of robustness for estimators of the variance of the sample mean arising in steady-state simulation experiments. The alternative definition implies that-of all known batching estimators-overlapping-batch-means estimators have both optimal mean squared error and optimal robustness.